News & Event

Shenzhen Tsinghua University Open house Seminar was successfully held in the Lecture Hall of Shenzhen Tsinghua University Graduate School from 31st March to 1st April this year. This Open house is mainly organized by the Graduate School of Shenzhen Tsinghua University and co-organized by ULVAC-PHI and PHI (China) Limited. There were around 200 participants who have joined the Open house. The participants were not only from the teachers and students of Tsinghua University Graduate School, but also some surface analysis experts from other districts in China.   Shenzhen Tsinghua University Open House Seminar was like a combination of ‘Seminar’ and ‘Training’. In the seminar part, Scientist of ULVAC-PHI Dr. Chang Hsunyun was one of the guests to present the latest techniques and applications of surface analysis in order to let the participants to have deeper understandings on the information and applicable areas of surface analysis instruments. For the training part, Executive Director of PHI (China) Mr. Wensly Yip was another guest to have a sharing on the data analysis of XPS. He also talked about packaging by XPS, peak-differentiating and imitating, in-depth analysis and imaging processing methods. Besides, Professor Zhang and Mr. Yip have provided technical consultations to all the participants. Both of them have explained and presented the functions and characteristics of XPS to the experts and professors. They answered their questions one by one and enhanced the understandings in XPS in terms of the wide range of possible applications.   There is a booth at the seminar   Scientist of ULVAC-PHI Dr. Chang Hsunyun had given a talk to the audiences   Executive Director of PHI (China) Mr. Wensly Yip had given a talk to the audiences

(This page is in Chinese only.  For details, please kindly contact our representative.)   【第一轮通知】  高德公司 邀请函 清华大学深圳研究生院 表面分析技术应用研讨会暨光电子能谱仪培训班   清华大学深圳研究生院于2016年底完成PHI 5000 VersaPrboe-II扫描聚焦型X射线光电子能谱仪器（ULVAC-PHI,Inc.）的安装、调试工作，设备全部功能现已正式对外开放。光电子能谱仪被广泛应用于各类材料的研究中, 包括：有机发光体(OLED)、太阳能电池、锂电池、燃料电池、石墨烯、食品安全等。借助表面分析手段，可实现产品工艺改良和性能提高的目的，尤其光电子能谱(XPS)和紫外光电子能谱(UPS)都提供了材料的关键信息，是不可或缺的研究手段。目前，XPS可实现较高的空间分辨（＜10um）能力，配合团簇离子源的逐层剖析功能可实现多层有机/无机结构材料无损深度分析, 进一步提高了表面分析应用的深度和广度。此外, 配合样品传输管可使样品在真空或惰性气氛下转移和传输，有效地避免样品在转移过程中可能存在的污染。   为增进广大师生对XPS功能的了解，提高对XPS数据分析处理能力，清华大学深圳研究生院材料与器件检测中心将邀请ULVAC-PH原厂工程师及其中国代表公司PHI(China)高德英特(北京)科技有限公司相关工程师，针对该中心现有X射线光电子能谱仪仪器的功能和应用范围,开展一次技术交流活动。本次活动将分为两个主要部分：第一部分将以研讨会的方式进行,邀请ULVAC-PHI原厂科学家对表面分析最新的技术和应用作出讲解，让与会者再一次清楚的了解现今的表面分析工具可以提供怎么样的讯息，以应用在各种研究范畴上；第二部份以培训班进行，目的为提供参会人士如何对光电子能谱的分析数据进行进理、包装定性定量、分峰拟合、深度分析和图像处理的方法。活动详细安排如下:   一、会议时间、地点 会议时间：2017年3月31日 下午2:00 至 6:00  　　　　　2017年4月1日上午 9:00 至 下午 6:00 地点：清华大学深圳研究生院能源与环境大楼报告厅   二、会议安排   2017年3月31日　　 -　环境大楼报告厅 　　　　　　　　　　1:30pm ~ 2:00pm　-　报到时间 　　　　　　　　　　2:00pm ~ 2:10pm　-　研讨会开场, 领导致辞 　　　　　　　　　　2:10pm ~ 2:50pm　-　XPS 的多种应用讨论叶上远 (PHI China) 　　　　　　　　　　2:50pm ~ 3:30pm　-　ULVAC-PHI 科学家应用讨论报告 (ULVAC-PHI) 　　　　　　　　　　3:30pm ~ 4:00pm　-　小息时间, 仪器参观 　　　　　　　　　　4:00pm ~ 4:30pm　-　ULVAC-PHI 科学家 XPS 原理 (ULVAC-PHI) 　　　　　　　　　　4:30pm ~ 5:30pm　-　Live Demo 实时分析演示和讨论 5:30pm ~ 6:00pm　-　Q & A   2017年4月1日　　 -　环境大楼报告厅 　　　　　　　　　　9:00am ~ 10:15am　-　全谱/窄谱, 峰较正, 定性/定量分析, 灵敏因子 　　　　　　　　　　10:15am ~12 noon　-　分峰拟合, 峰形, 峰背景概念 　　　　　　　　　　1:30pm ~ 3:00pm　 -　分峰拟合复杂案例分析 　　　　　　　　　　3:00pm ~ 3:30pm 　-　小息时间 　　　　　　　　　　3:30pm ~ 5:00pm　 -　深度分析, 线扫瞄, 面扫瞄影像数据处理 　　　　　　　　　　5:00pm ~ 6:00pm　 -　Q & A   三、会议报名与收费                                研讨会会议免费。请以以下格式报名, 将报名信息填妥后发送邮件至: geng.huanran@sz.tsinghua.edu.cn 或电话联络：耿焕然: +86-15019479017 （0755-26036417）   参会人姓名： 单位名称： 联系电话：   (注：为合理安排会场，请大家提前报名，报名截止日期为2017年3月27日)。   高德英特（北京）科技有限公司 ULVAC-PHI Incorporated

International Symposium on Advanced Functional and Computational Materials 2017 was successfully held in Shenzhen from 7th to 8th January this year. This conference was organized by Tsinghua-Berkeley Shenzhen Institute and Graduate School of Shenzhen Tsinghua University. This international conference attracted more than two hundred academic specialists, experts, professors and students from different regions such as China, the United States, Japan and Hong Kong, etc. It investigates the development of advanced functional materials and calculating materials through the perspectives of academic and industrial and combined both for a promotion of continued industrial development.   This is the first time for Tsinghua-Berkeley Shenzhen Institute to organize an international conference. It has already raised the public awareness and passionate participation before the conference. It is a great platform for different regional intelligent experts to communicate and cooperate in order to propel the application process of advanced industrial materials and calculating materials. CoreTech Integrated Limited as PHI in China was so honored to be one of the exhibitors of the conference. CoreTech had successfully raised the professional expert and professor’s awareness on the Surface Analysis Techniques including XPS, AES and Tof-SIMS. Senior Sales Manager Lucy has explained and presented the functions and characteristics of XPS to the experts and professors. She answered their questions one by one and enhanced the understandings in XPS in terms of the wide range of possible applications.   CoreTech sets up a booth at the conference   The venue of International Symposium on Advanced Functional and Computational Materials 2017

Our newsletter Vol. 0051 -  CoreTech Website's Newest function - Technical Video is released now!     You may read the full version either by accessing Technical Info > Newsletter or click here!

The 3rd Asian Clay Conference (ACC-2016) was successfully held in Guangzhou on 18th to 20th November this year. This conference was organized by Guangzhou Institute of Geochemistry, Chinese Academy of Sciences with the co-organizers including Southwest University of Science and Technology, Chinese Society For Mineralogy Petrology and Geochemistry ,National Natural Science Foundation of China and Guangzhou Association for Science and Technology etc.   In this international conference, there were about 250 honored guests from around hundreds of popular university and science organization. CoreTech Integrated Limited was so honored to be one of the exhibitors of the conference. The theme of the conference this year is “Small Size, Big Science”. The genesis and transformation of clay minerals, geochemical processes and biochemical interactions concerning clay minerals are the main topics of the conference. CoreTech successfully raised the professional expert and professor’s awareness on TOF-SIMS. Senior Sales Manager Lucy has explained the functions and characteristics of TOP-SIMS. It drew interests of geologists, chemists and biologists.   This is the golden opportunity to let CoreTech being invited to be one of the exhibitors this year. This international conference is a great learning platform for us to communicate and interact with different experts, professors and students. We were so glad to present our newest products and raise the brand awareness of CoreTech.   CoreTech sets up a booth at the conference   Senior Sales Manager Lucy from CoreTech has explained the characteristics of TOP-SIMS to the experts and professors

To all the teachers, specialists and users:   CoreTech is going to have a Webinar on the Instrument.com.cn. The speaker is Wensly Yip from our company. The Webinar is about Easy Peak Identification for TOF-SIMS Molecular Imaging by Simultaneous Tandem MS Imaging. Please feel free to join the Webinar.   The details of the Webinar are as below: 　　　　　　　　　　　　　　　　　　　Date: 02 December, 2016 (Friday) 　　　　　　　　　　　　　　　　　　　Time: 10:00 am to 11:30 am 　　　　　　　　　　　　　　　　　　　Topic: Easy Peak Identification for TOF-SIMS Molecular Imaging by Simultaneous Tandem MS Imaging   Webinar description: Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is widely used in industrial fields such as impurity analysis of semiconductors, analysis of high technology micro scale materials, and mass spectrometry of polymer and organic materials. Despite dramatic improvements in surface sensitivity and the resulting measureable spatial resolution, the unique identification of each detected mass peak within the mixture of additives and polymer compositions on the surface of real polymer samples has remained problematic. In order to solve this problem, we have developed the TOF-SIMS instrument equipped with tandem MS (MS/MS), and applied it to the various kinds of organic materials. From simplified MS/MS spectrum, the spectrum interpretation is much easier than before. In this tutorial, we will introduce our unique instrument, and demonstrate its capabilities.   If you are interested, please feel free to join the Webinar at http://www.instrument.com.cn/webinar/meeting/meetingInsidePage/2218.   CoreTech Integrated Limited ULVAC-PHI Incorporated

2016 ULVAC-PHI International Sales Meeting was successfully held from 11th to 14th October this year. This sales meeting is held biennially for the entire sales teams from all around the world. This year, the sales team members from Europe, United States, Korea, Russia, Malaysia, Philippine and Hong Kong all have joint together. In the conference, ULVAC-PHI gave the recognition to CoreTech team for the outstanding work performance. CoreTech was one of the most diligent sales agents in Asia in the past years. We were so honored to receive the reward from ULVAC-PHI.   Award from ULVAC-PHI   Group photo of ULVAC-PHI International Sales Meeting

Secondary ion mass spectrometry (SIMS) is a technique of instrument used to analyze the composition of solid surfaces and thin films. Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is an important surface-sensitive analytical method that uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the very outermost surface of the sample. Also, it is a very sensitive surface analysis technology that accurately determines the composition of the sample surface elements.Through the analysis of the molecular ion peaks and functional fragments, it can be more convenient to ensure the surface compounds and structures of samples after the techniques of scanning and stripping the sample surface. The sample surface or even three-dimensional composition diagram can be got with higher analysis accuracy.   The 6th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS) is successfully held by the key laboratory of Chinese Academy of Science. This is from 8th to 11th October in Dalian Institute of Chemical Physics of Chinese Academy Of Science this year. More than 100 surface analysis specialists from the overseas and local specialists interested on Secondary Ion Mass Spectrometry joined the conference.   SIMS is an international conference which invited around one hundred SIMS researchers including local and foreign experts. Professor Ian Gilmore (President of SIMS last year) from the National Physical Laboratory, Professor Andrew Ewing from University of Gothenburg and Professor Jiro Matsuo from Kyoto University were invited to the conference. Apart from that, the Professor Shyue Jing-Jong from Academia Sinica, Dr. ShinIchi lida from ULVAC-PHI and Wensly Yip from CoreTech Integrated Limited have done some excellent presentations to all the specialists in order to raise the discussion in the perspectives of SIMS instrument investigation and theory development. Professor Shyue Jing-Jong from Academia Sinica has presented the topic as “Depth profiling of soft materials with cluster-atomic ion co-sputter”. Mr. Wensly Ip from CoreTech has presented the topic as “Analyzer Acceptance Angle & The Advent of 3D Chemical and Molecular Imaging by FIB-TOF Tomography” and Dr. ShinIchi lida has presented the topic as “Easy Compound Identification in TOF-SIMS By using Parallel Imaging MS/MS”. It raised the awareness and discussion from the participants.   This conference provided a platform to let CoreTech and the other specialists to have the technical exchange, academic investigation and further cooperation. This international conference is a great learning platform for us to communicate and interact with different experts, professors and students. We were so glad to know more about the future development trend and the customers’ needs of Secondary ion mass spectrometry.   Venue of The 6th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS)   CoreTech China Executive Director Mr. Wensly Yip had given a talk to the audiences   Dr. ShinIchi lida had given a talk to the audiences

Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO) Open house is successfully held in September this year. SINANO is set up by the Chinese Academy of Science. Chinese Academy of Science is an important standard in the academic field of China. In this Open house, SINANO mentioned that it bought a new machine from ULVAC-PHI and they hoped it could demonstrate its capabilities.   The joined parties included Wintech Nano-Technology Services, Baosteel, Enkris Semiconductor, Dalian University of Technology, Shanghai Normal University and around 50 teachers and students from Sinano. The participants interacted and discussed about the new development of XPS. Professor Li-Zhangping from Tsinghua University, Professor Shyue-Jingjong from Taiwan Academia Sinica and Mr. Wensly Yip from CoreTech and Professor Urushihara Nobuaki from ULVAC-PHI were honored to be invited to make a brilliant talk.   2016 Sinano Open House   Wensly Ip had given a talk to the audiences.   Professor Urushihara Nobuaki from ULVAC-PHI had given a talk to the audiences.

2016 China National Surface Analysis Conference is held on 11th to 12th August in Kunming this year. More than 100 surface analysis specialists joined the conference.    CoreTech China Executive Director Mr. Wensly Yip and Mr. Takuya Miyayama from ULVAC-PHI have presented the new products and techniques in the conference. The Managing Director of CoreTech Dr. Huck Chen was also interviewed by the editor from instrument.com.cn. Mr. Wensly Ip from CoreTech has presented the topic as “The study of how primary beam affect the analysis result is surface analysis” and Mr. Takuya Miyayama has presented the topic as “Introducing the newest MS/MS capability in the Time-of-flight SIMS’’.     Related News: Instrument.com.cn   2016全国表面分析会议召开 应用领域与技术不断拓展 http://www.instrument.com.cn/news/20160815/199180.shtml   “让用户满意最重要”——访高德英特公司总经理陈文征博士 http://www.instrument.com.cn/news/20160810/198895.shtml   Group photo of 2016 China National Surface Analysis Conference Grand Opening.   The Managing Director of CoreTech Dr. Huck Chen had given a talk to the audiences.   CoreTech China Executive Director Mr. Wensly Yip had given a talk to the audiences.   Mr. Takuya Miyayama from ULVAC-PHI had given a talk to the audiences.