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Recently, installation and commissioning of PHI 710 Auger NanoProbe has been completed at Nano-X of Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Science. This is the second large-scale scientific instrument purchased by Nano-X from ULVAC-PHI, Inc. after PHI XPS. As an important surface analysis equipment, PHI 710 Auger NanoProbe will be connected with Nano-X's ultra-high vacuum interconnection pipeline, further improving Nano-X's existing surface analysis equipment system (XPS, TOF-SIMS, SEM, AFM, STM, etc.).  It will help in promoting the development of research in the fields of catalysis, semiconductors, microelectronics and metallurgy, etc.       AES Functioned Introduction Auger Electron Spectroscopy (AES) is a surface analysis method that uses electron beam to ionize and excite the inner layer electrons from atoms, then measuring the energy of the auger electron emitted during relaxation to investigate the surface composition and chemical characteristics from samples. AES is not only surface sensitive, but also has very high spatial resolution in nano meter level, therefore it has been widely used in scientific researches such as semi-conductor, micro-electronics and metallurgy.     The main features of PHI 710 Auger NanoProbe include SEM imaging, semi quantitative/chemical analysis of element composition, one/two dimensional element distribution, depth profiling and EBSD analysis. This instrument is equipped with a thermal emission electron gun, which has a small and robust spot size, SEM imaging resolution ≤3nm, AES imaging resolution ≤8nm; uses a CMA coaxial analyzer, capable of collecting Auger electrons from all angles, therefore it does not limited by the shape or the angle of the sample; the energy resolution 0.5%~ 0.1% is continuously adjustable, and can achieve high sensitivity and high transmission rate; uses Ar ion gun to achieve sample surface sputter cleaning, charge neutralization and depth profiling; And uses electron backscatter diffraction detector (EBSD), which can provide the analysis of lattice structure and orientation.     For more information, please follow our WeChat account. We will share information and knowledge on surface analysis technology.     Welcome to join our Surface Analysis exchange group   Introduction of Nano-X Nano-X is the world's first large-scale scientific device in the field of nanotechnology that integrates material growth, device processing, testing and analysis under construction in accordance with national major scientific and technological infrastructure standards. Nano-X connects the various instruments through ultra-high vacuum pipelines. It solves the pollution problems of dust, surface oxidation and adsorption that are difficult to solve in the traditional ultra-clean room mode. On the other hand, it provides an achievable platform for the innovation of microscopic atomic scale new materials and devices and the innovative thinking mode based on atomic order and controllability.  Nano-X is composed of a material preparation platform with multiple comprehensive functions, equipment technology platform and test analysis platform. Nano-X is an irreplaceable advanced method and comprehensive research platform in the research of many disciplines such as materials science, environmental science, physics, chemistry and information science. It is also an important means of research and development of advanced industrial technologies, such as microelectronics and new materials.     Introduction of PHI Physical Electronics, Inc. formerly known as Perkin Elmer, is a professional surface analysis instrument department and was acquired by Japan ULVAC, Inc. in 2003 and established ULVAC-PHI, Inc.  ULVAC-PHI, as the world's most professional manufacturer of surface analysis instruments, has more than 60 years of research and development and production history, focusing on the development and production of surface analysis instruments.  Their products include XPS, AES, ToF-SIMS and D-SIMS.  PHI CHINA is committed to provide users with advanced technology and high-quality services, and promote the application and development of surface analysis technology together with everyone.  

In recent years, science and technology are developed rapidly. Advanced surface analysis technology has become a necessary experimental technology for surface characteristics research in the fields of materials, energy, and catalysis, microelectronics, and semiconductor industries. As an important large-scale scientific instrument in the field of surface analysis, XPS can provide surface composition and chemical state information.  It is widely used in scientific research and high-tech industries and other fields which is important in solving complex problems.   At the invitation of Shenzhen International Graduate School of Tsinghua University, Dr. Ju Huanxin being a presenter in the Lecture of Advance Battery Material Industry and gave the first lesson about XPS. During the lesson, Dr. Ju explained the fundamental review and technologies features with applications. Also, he introduced the application of micro-focus scanning XPS in micro area analysis and depth analysis.     Testing Technology Center of Materials and Devices of Tsinghua Shenzhen International Graduate School (MDTC) was established in 2008. It was recognized by China National Accreditation Service for Conformity Assessment (CNAS) in 2013 and authorized by Canadian Standards Association (CSA) in 2016.MDTC is an important institution that provides notarization and authoritative testing data capabilities for scientific research and quality appraisal inside and outside the school. At present, MDTC has two major technology platforms: Material Testing and Analysis platform and Battery Testing platform. Each platform has completed testing equipment, with a total value of more than 100 million dollar.Scanning focused X-ray photoelectron spectroscopy from ULVAC-PHI is important equipment in the spectroscopy platform. The equipment not only meets the qualitative and quantitative analysis of the surface composition and valence state of materials and devices, but also achieve chemical state space imaging and in-depth analysis of multiple etching modes.     You may watch back the video by accessing Technical Info > Technical video

Industry 4.0, as a high-tech strategic plan, refers to make use of Cyber-Physical System (CPS), to digitize and intelligentize the supply, manufacturing, and sales information in production, and finally achieve fast, effective, and personalized product supply. The transformation from centralized control to decentralized enhanced control will eventually establish a highly flexible production model of personalized and digital products and services.  However, after the actual production process is coordinated with various business management systems, the future manufacturing system will become more complex. The research and development, quality control, and failure analysis, etc. of the system will become more important for the operation of the entire Internet of things (IoT) system.     In the Industry 4.0, field operators input different customized requirements into each product chip.  Then online production machinery read relevant data through induction device.  According to the pre-designed program, the production line is automatically adjusted to the manufacturing process of the product.  In this way, the problem between “mass production” and “customization” has been greatly resolved. Under current fierce market, the multi-variety mixed-flow production model has become a norm of many enterprises. BASF Corporation has a history of 150 years. Its products include chemicals, plastic products, oil and gas etc.  In recent years, BASF has collaborated with the German Research Center for Artificial Intelligence to design consumer-oriented IoT systems. BASF’s smart factory in Kaiserslautern is the R & D base of the group’s customized production line. Although there is only one production line, it can produce ever-changing shampoos and shower gels, which can be completely customized.  The IoT system helps in transforming mass production into mixed-line production, and each production link incorporates variety of analysis technologies.  ULVAC-PHI's PHI5000 Versaprobe is used in the research and development, quality control and failure analysis to analyze the material composition and chemical state, which makes the operation of the entire production line faster and more efficient.     ▲ULVAC-PHI XPS PHI5000 Versaprobe     ▲PHI5000 Versaprobe helps in mixed-line production   As a leader in the field of surface analysis instruments, ULVAC-PHI has industry-leading surface analysis technologies and products, which can provide multi-level technical support for key links in scientific research and high-tech industries and help advance the process of Industry 4.0!     *Image and video source: BASF   You may watch back the promotional video of BAFS > Technical video

Insight into Nano Depth - New Fraunhofer IPMS X-ray photoelectron spectrometer enables tiny particle analysis   We are in an era of rapid development of information technology, which chips can be described as an artificial intelligence nerve cell, transmitting important information and signals to smart devices through billions of tiny components inside. Nowadays, the semiconductor chips built in smart devices are getting smaller. However, their functions are getting more powerful and higher efficiency.     Since the nano-scale surface structure can no longer be recognized by the naked eye, in order to analyze the surface characteristics of silicon wafers in the nanometer depth range, Fraunhofer Institute for Photonic Microsystems (Fraunhofer IPMS) purchased a high-performance hard X-ray photoelectron spectrometer (XPS) from PHI Electronics GmbH.   Dr. Benjamin Uhlig, principal investigator of the Fraunhofer IPMS Institute said “PHI's new Quantes hard X-ray photoelectron spectrometer can detect surface features, film structures and surface contaminants in the nanometer depth range without causing any damage. In order to accurately analyze the chemical composition on the surface of the chip, it is very important to detect the nano-depth area. This new feature of XPS will allow everyone to clearly understand the manufacturing process of semiconductor chips. It will play a key role in optimizing chip performance in the future.”   The Hard X-ray photoelectron spectroscopy  (XPS) by Physical Electronics GmbH Another advantage of this new XPS instrument is versatility. In addition to using the Al-ka X-ray source (1486 eV) for conventional XPS measurements, we can conduct analytical experiments that extend deeper. The system is equipped with a Cr-ka X-ray source (5414 eV), which can provide an analysis depth of about 22 nanometers to the Si chip. It is three times the conventional XPS detection depth (about 7 nanometers) based on Al-ka X-rays.Dr. Benjamin Uhlig said “Through the hard X-ray photoelectron spectroscopy, we can analyze transition metals well. The system can clean the sample surface and also perform depth profile analysis.  In addition, it can also perform XPS test analysis of samples from -120°C to 300°C with variable temperature and experiments with potential contact samples. "   The secondary electron imaging (SXI) of the system can locate very small structures on the sample accurately. The hard X-ray XPS system of the Fraunhofer IPMS Institute can be used for extensive comprehensive analysis. At the same time, the Fraunhofer IPMS has provided various cooperation opportunities in product development for major companies in the world.The Fraunhofer IPMS invested in a hard x-ray photoelectron spectrometer as part of German microelectronics research project. This investment is funded by the Federal Ministry of Education and Research and aims to promote Germany into a science and technology center.   Background information The Fraunhofer Institute for Photonic Microsystems (Fraunhofer IPMS) locates in Dresden, Germany, provides future-oriented solutions for industrial manufacturing and automation, as well as medical technologies that improve the quality of life. Fraunhofer IPMS has more than 350 scientists and engineers who have demonstrated the highest level in the fields of optical sensors and actuators, integrated circuits, wireless data communications and microelectronics.     Information Sources: https://www.ipms.fraunhofer.de/en/press-media/press/2020/X-ray-photoelectron-spectrometer.html https://www.ulvac-phi.com/en/company/

With rapid development in science and technology recent years, advanced surface analysis technology has become a necessary experimental technology for surface characteristics research in the fields of materials, energy, catalysis, microelectronics, and semiconductor industries.   XPS is an important scientific instrument in surface analysis, which can provide surface composition and chemical state information.  It is widely used in scientific research and high-tech industries as well and take an important role to solve complex problems.     Perovskite materials itself have the characteristics of direct band gap, bipolar transport, high absorption coefficient, low exciton binding energy, long carrier diffusion distance and solvability. It has a rapid development in recent years. However, perovskite materials are sensitive under the effect of light, electric field, temperature, water and oxygen content in the environment, thus seriously hindering the commercialization of perovskite solar cells. Comparing to traditional three-dimensional (3D) halide perovskite solar cell materials, two-dimensional Ruddlesden–Popper (2DRP) layered perovskites exhibit improved photostability and thermal stability because of its’ improved moisture resistance, excellent light stability and thermal stability, ultra-low self doping behavior and significantly reduced ion migration effect. The stability of 2DRP layered perovskite come from the protection of organic amines on the surface, the effective regulation of perovskite tolerance factor in low dimension, and the interlayer interaction by the van der Waals force and hydrogen bond. But as the hydrogen bond and van der Waals force are weak, the improvement of the layered framework stability is limited, at the same time, the weak interaction between 2DRP perovskite layers limited it’s self-assembly and the charge transport across the layers. Therefore, the thin film quality of perovskite active layer and the separation and transmission characteristics of photocarriers are affected.     To solve this scientific quest, Huang Wei, academician of Flexible Electronics Research Institute, Northwestern Polytechnical University, Professor Chen Yonghua, Institute of advanced materials, Nanjing University of technology and Professor Zhang Lijun, National Key Laboratory of Integrated Optoelectronics / School of materials, Jilin University reported an efficient and stable layered perovskite solar cell together.   By innovatively introducing an organic amine with a S (Sulfur) atom, the interaction between the layers can be regulated effectively by the S-S interaction, the charge transfer across the layered are enhanced and the layered perovskite framework are further stabilized, and therefore prepared high performance 2DRP layered perovskite solar cells with efficiency reached 18.06% (certification efficiency 17.6%). Meanwhile, the reinforced interlayer interaction has significantly improved the moisture and thermal stability and the device stability of 2DRP perovskite film. The device can keep at maximum output under standard sun light for 1000 hours with less than 15% attenuation of efficiency. The related achievements were published in nature Photonics (nature photonics 14, 154 (2020). Doi: 10.1038 / s41566-019-0572-6) under the title of “Efficient and stable Ruddlesden–Popper perovskite solar cell with tailored interlayer molecular interaction”.   The mechanism of the interlayer interaction is one of the key points of this research. Dr. Ju Huanxin from Phi China Laboratory is honored to be in this research, measuring the XPS spectra of S2p, C1s, N1s, I3d and Pb4f through the high-resolution PHI XPS. The result of this research shown that the interaction of S elements provides a favorable data support for the study of kinetics, stability and charge transfer characteristics of 2DRP layered perovskite films.     Introduction of PHI CHINA Nanjing Laboratory PHI CHINA Nanjing laboratory was established in December, 2018.  It is committed to provide technical support for PHI CHINA surface analysis equipment and promoting the application of advanced surface analysis technology in scientific research and high-tech industries through cooperation. At present, the XPS system in PHI CHINA laboratory integrates multiple surface analysis technologies (XPS-UPS-IPES-GCIB): the unique scanning-focus XPS can provide high surface sensitivity (   Dr. Ju Huanxin, former associate researcher at the National Synchrotron Radiation Laboratory of the University of Science and Technology of China, is mainly engaged in the research of soft X-ray spectroscopy methodology and the electronic properties of energy materials / device interfaces. He joined PHI (China) Limited in November, 2018 as Application Scientist, responsible for the setup and operation management of PHI CHINA Nanjing surface analysis laboratory.  In cooperation with users in academic research, he has published more than 80 academic papers in Nature Photonics, Nature Chemistry, Nature Energy, Nature communication, J. Am. Chem. Soc., Angew. Chem. Int. Ed, Adv. Mater and other journals.       Link: https://www.nature.com/articles/s41566-019-0572-6

PHI CHINA Surface Analysis Technology Online Lecture has been launched for three sessions successfully.  We are very grateful for all of your widespread attention and praises. In order to give more and better technology to everyone, PHI CHINA will start another online lecture this week with topic on “PHI CHINA Surface Analysis Technology Online Lecture – TOF-SIMS”.   Time of Flight-Secondary Ion Mass Spectrometer (ToF-SIMS) uses primary pulsed ions to enter the surface of the solid material and detects the secondary ions excited by the surface to base on their flying speed hence meaning their mass to characterize the elemental composition, molecular structure, molecular bonding, etc. on the material surface.     First Lecture: TOF-SIMS fundamental review and technologies features and applications Time: 19th March 15:00 Presenter: Ms Lu Defeng, Senior Application Expert of PHI CHINA 1. SIMS fundamental review (including D-SIMS and TOF-SIMS) 2. The TOF-SIMS main functions and capabilities 3. Various applications of TOF-SIMS                   Second Lecture: TOF-SIMS instrument hardware, function and features Time: 20th March 15:00 Presenter: Mr Xin Guoqiang, Customer Service Supervisor of PHI CHINA 1. TOF-SIMS System component and functions 2. The fundamental review of TRIFT analyzer 3. The fundamental review of LMIG ion gun 4. Depth profiling analysis using different ion gun 5. PHI NanoTOF II unique features             Third Lecture: TOF-SIMS Sample preparation, experiment and analysis processes and data interpretation Time: Pending Presenter: Dr. Zhang Hsunyun, ULVAC-PHI Application Scientist 1. Sample preparation for different samples with different test requirements 2. Demonstration of sample testing experiment and analysis process 3. How to use software for data analysis & interpretation (Mass spectrum analysis, MAPPING, depth profiling data interpretation and 3D imaging, etc.)                               This 3-days lecture this time will conduct in the form of live broadcast and answering questions online.  Senior Application Experts from PHI CHINA and ULVAC-PHI Application Scientist will partner to run the TOF-SIMS lecture show together. Although the COVID-2019 is not over yet, learning cannot stop. Please scan the QR code above and sign up for the online lectures, and keep following us.  More information and knowledge sharing are coming soon.       To review Q & A, you may access Technical Info > Application Notes   You may watch back the video by accessing Technical Info > Technical video

Since February 11th, PHI CHINA started the online lecture on XPS for four weeks. We received widespread attention and praises. In order to meet the eager learning needs of everyone, PHI CHINA will start another 3 days online lecture topic on “PHI CHINA Surface Analysis Technology Online Lecture – AES” from March 11 to March 13 at 3 pm every day.   March 11 Ms Lu, Defeng AES fundamental review and technologies features with applications Main Content: AES fundamental review: including Auger electron generation, its technique featured capabilities; spatial resolution, detection limit, qualitative and quantitative analysis; basic composition of AES instrument and features of its energy analyzer. The AES main functions: including basic spectrum acquisition, line scan, mapping images, sputter depth profiling; Cold fracture sample analysis, in-situ FIB + EDS + BSE + EBSD combing into one system as a complete solution for material characterization. Main application of AES: including Nano materials, metal, semiconductor, catalytic material, energy battery, photovoltaics and anatomy of the film structure.   March 12 Mr Xin, Guoqiang AES instrument hardware, function and features Main Content: System component Vacuum system The fundamental review of energy analyzer Eectron gun and electron detector The fundamental review of ion gun AES instrument functions and features   March 13 Mr Yip, Sheungyuan Wensly AES Sample preparation, data acquisition and interpretation Main Content: Sample preparation for different analysis requirements Simple interpretation for AES result data, from raw spectrum to differentiate spectrum then further to qualitative and quantitative analysis How to use the software and PHI Auger Handbook for data processing such as overlapped peaks problem Auger spectrum background subtraction Data interpretation for Line scan and Map acquisition How to use LLS to perform data interpretation for AES depth profile; AES analysis from conductor to semiconductor, and how to utilize the function charge neutralization in analysis   This lecture will continue to use the live broadcast and answer questions online.   PHI CHINA has been in the field of surface analysis for many years, focusing on the development and research.  PHI CHINA hopes this series of online lecture can help all of you to enrich your knowledge, upgrade your skills and also working with everyone to further promote the application and development of surface analysis technology.   For more information, please follow our WeChat account.  We will share information and knowledge from time to time in order to help you on scientific research.     To review Q & A, you may access Technical Info > Application Notes   You may watch back the video by accessing Technical Info > Technical video

On 6th March, with completion of the last online lecture, “PHI CHINA Surface Analysis Technology Online Lecture – XPS” has finished successfully.   During this hard time, in order to enable teachers and students have better understanding on XPS in surface analysis technology and make use of MultiPak for data processing, PHI CHINA broke the conventional training mode in the past years and started the online lecture for the first time. Although the teachers and students come from different region, they can still study from home by joining PHI CHINA online lecture.     Starting from 20th February and the following continuous 3 weeks, PHI CHINA based on the principle of "thematic lecture + Q & A" and the basis of "theory + practice", introduced XPS fundamental review and technologies features with applications, Surface Analysis Sample preparation & Introduction and related precautions on data collection and how to use MultiPak for XPS data processing online. In each online lecture, our lecturer prepared Q&A session which aimed to let each attendee understood more thoroughly and improved learning efficiency. This series of online lecture has received widespread attention and praise for teachers, students and customers.   This online lecture not only innovated a way of learning, but also solved the problem about inappropriate timing to gather on learning during the COVID-2019. It achieved to learn from home, consolidated and enhanced everyone's professional knowledge and achieved good results. PHI CHINA heartfelt thanks for all of your support and participation in this online lecture. In the future, PHI CHINA will continue to innovate new service mode, organize more training and exchange activities, and provide a better service to everyone. PHI CHINA also wishes all of you can protect the health of yourself and your families during the period of COVID-2019. Let us look forward to the coming of spring together!   Should you have any training and technical communication needs, please leave us a message.   Warm reminder Lectures “PHI CHINA Surface Analysis Technology Online Lecture – AES”  will be starting from March 11th to 13th   You may watch back the video by accessing Technical Info > Technical video

The video for Physical Electronics (PHI) introduction is available now!   You can go to the following link to watch : Youtube : https://youtu.be/dfqg8LmVYNI Youku : https://v.youku.com/v_show/id_XNDU2NjA5MjYwOA==.html

After the last lecture series “PHI CHINA Surface Analysis Technology Online Lecture - XPS” for PHI users completed successfully, PHI CHINA had organized another online lecture for Universities teacher and students.  The first lecture started from February 20 and more than thousands of teachers and students from over 90 universities and research institutes in China joined. In the coming three weeks, we will share more informative and useful contents about Surface Analysis. Let’s explore more about the surface analysis technology!   Under the critical period of COVID-2019, epidemic prevention measures concerns everyone’s life & health. To reduce risk of public cross-infection and transmission, high schools announced to postpone beginning of the spring semester. Although students can only stay at home now, the epidemic would only be temporary while study learning is really a long-term process. Once the epidemic is over, by well preparation, students can go for scientific research and reach the peak of science again! XPS, as the important scientific instruments in surface analysis technology, it widely uses in the scientific research and high-tech industries.  ULVAC-PHI provides scanning XPS Microprobe with high sensitivity (   XPS is already an irreplaceable tool in materials analysis. However, many people are still having questions about testing and data analysis such as: How to prepare sample? How to perform the micro area analysis? How to calculate thin coating thickness in depth profile? How to do the curve fit? How does work function calculate? What to do if unable to get satisfactory results when the conduction band and band gap are tested, etc.   Don’t you have similar questions?   In order to help all of you with deeper understanding on XPS feature and data analysis and let XPS helps to enhance scientific research, this XPS online lecture series targets to all teachers and students in the field of scientific research.  During the online lectures, we will explain XPS/UPS/LEIPS fundamental review and technologies features with applications, XPS instrumentation, sample preparation and transportation and how to use MultiPak to correctly interpret the XPS spectrum data into useful research information. The arrangement of these online lectures is as follows:     Lecture Lecture Time Lecture Detail 1 2020/02/20 15:00 XPS fundamental review and technologies features with applications (1) 2 2020/02/21 15:00 XPS fundamental review and technologies features with applications (2) 3 2020/02/26 15:00 UPS/LEIPS fundamental review and technologies features with applications 4 2020/02/27 15:00 Typical XPS instrumentation & features 5 2020/02/28 15:00 Surface Analysis Sample preparation & Introduction and related precautions on data collection 6 2020/03/03 15:00 Principles of XPS data processing and MultiPak functions 7 2020/03/05 15:00 How to use MultiPak for XPS data processing (1) 8 2020/03/06 15:00 How to use MultiPak for XPS data processing (2)   If you are interested in XPS or other surface analysis technology, please feel free to follow our Wechat account.  PHI CHINA will continue introducing more informative content.  Let's explore the surface analysis technology together!     You may watch back the video by accessing Technical Info > Technical video