The PHI nanoTOF 3+ is an advanced multifunctional Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) instrument capable of achieving precise surface mass analysis in microscale areas - all within a single system.
Key features:
- Triple focusing electrostatic analyzer: Achieving high mass resolution, high sensitivity, and reduced shadows on uneven surfaces
- Advanced Ion Beam Technology: Produces high spatial resolution mode at <50 nm
- Automated unattended analysis: Auto sample bias adjustment enables unattended measurements, even on insulating samples
- High-Throughput analysis: Automated sample transfer system with built in parking
- Dual-beam charge neutralization (option): Easily neutralizes surface charge of insulating sample
- Cross section analysis (option): FIB processing to cross-sectional TOF-SIMS imaging with a single ion gun
- Parallel Imaging MS/MS (option): Provides simpler information of molecular structure, such as terminal groups, linear chains, double bonds
- Remote access: Fully control the instrument remotely, once the sample is loaded into system
