ULVAC-PHI, Inc., headquartered in Chigasaki, Japan, is widely recognized as a world leader in surface analysis instrumentation. For decades, ULVAC-PHI has set the benchmark for X-ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES), and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS), delivering instruments that combine exceptional performance and reliability.
ULVAC-PHI continues to push the boundaries of surface characterization, most notably with its world-first technologies such as the dual scanning X-ray source for combined XPS and HAXPES analysis.
