News & Event

Our newsletter Vol. 0046 -  Versatile options of VersaprobeII-Gas Reactor is released now!     You may read the full version either by accessing Technical Info > Newsletter or click here!

Our newsletter Vol. 0045 -  Versatile options of VersaprobeII - VersaLock  is released now!     You may read the full version either by accessing Technical Info > Newsletter or click here!

Our newsletter Vol. 0044 - Hemispherical Energy Analyzer-Fixed Analyzer Transmission is released now!     You may read the full version either by accessing Technical Info > Newsletter or click here!

Our newsletter Vol. 0043 - Hemispherical Energy Analyzer-Fixed Retard Ratio Mode is released now!     You may read the full version either by accessing Technical Info > Newsletter or click here!

July 11th, 2015 Guiyang China - The growth of Surface analysis technology had been rapidly increasing in the past 20 years, and most of all it is major being used in different kinds of the Material analysis. CoreTech Integrated Limited as being Ulvac-Phi representative (PHI) in China had been invited to join into this annual event. There are more than 3600 participants joint into this conference including all the well-known Universities or Institutes in China, who all contributed to bring to a success of this event.   CoreTech China Executive Director Mr. Wensly Yip had joint into this conference together with our sales department leader Ms. Lucy Lu and Mr. Nice Pan. During the conference, CoreTech had extensively introduced the newest Surface analysis technologies from PHI to many participants.   Conference Entrance   Prof. Li He is giving a talk during the conference   CoreTech Integrated booth location in the Conference   CoreTech China Executive Director Mr. Wensly Yip (middle) Sales department leader Ms. Lucy Lu (right) and Mr. Nice Pan (left)

Surface Analysis technique had be rapidly growing in China for the past 20+ years.  It had highly contributed into the growth for the Universities research studies as well as to the industrial products development.  Since year 2012, China National Surface Analysis Conference had been organized at Tsinghua University and Sichuan Univeristy with great success.  This year, the Conference is held in the city of Ningbo from May-14 to May-17, 2015.   During the conference, the host from Ningbo Institute of Industrial Technology CAS Dr. Li Run-Wei had made an opening speech for welcoming all the participants.  After that, Professor Zhu Yong-Fa had re-emphasize the theme of every year conference is mainly in purpose for providing an open sharing platform for the public so does not matter if for the users or even instrument manufacturers, everyone should make use of this platform to make positive contribution to the Surface Analysis society.  CoreTech & ULVAC-PHI both very much agreed to this thinking concept, and hence very proudly to be the sponsor for this conference for the past consecutive 4 years.  CoreTech, as being "PHI in China", will continue to partner with ULVAC-PHI to provide the best Surface Analysis instrument and hereafter the best after-sale service to the China users.   In this year conference, there are more than 80 participants.  In total, 31 presentation talks were being given including invited speakers from National University of Singapore Prof. Chen Wei and Xu-Chang University Prof. Zheng Zi.  From CoreTech, Ms. Lucy Lu had presented on the Material applications using AES & Tof-SIMS.  Representing from ULVAC-PHI, Mr. Takuji Shibasaki had introduced the failure analysis of electronic devices using scanning XPS microprobe with AES.  After 2 days of busy but fruitful meeting, together with the highly participation from the attendants, 2015 Ningbo China National Surface Analysis Conference had been successfully completed, and let us look forward to conference in 2016 again.    Conference venue    CoreTech & ULVAC-PHI setting up a booth at the conference and presented the newest Surface Analysis technologies from ULVAC-PHI    Ms. Lucy Lu had presented the applications of AES & Tof-SIMS    Mr. Takuji Shibasaki introduced the failure analysis of electronic devices using scanning XPS Microprobe & AES

On March-20, 2015, CoreTech had been invited by the Yunnan instrument committee association to participate into the New Technologies of Analytical Instrument Conference in Kunming, China. The Yunnan instrument committee association is one of the leading organizations in the Yunnan province of China, who aim to provide new analytical technologies, new applications, and related technical skill supporting sharing platform to their members and users in the region.   The New Technologies of Analytical Instrument Conference is held base on the demand and request from the members of the Associations. Many of the nearby industrial companies had participated into this conference while as well as the major institutes within Yunnan province had joint too.   The conference was held at Kunming University of Science & Technologies. During the afternoon on March-20, experts from difference analytical instrument companies had presented the new technologies of the instruments and the applications. CoreTech member Ms. Lucy Lu and Mr. Nice Pan had joint into the conference, and had shared with the members about the newest Surface Analysis technologies from Ulvac-Phi, including using XPS (X-ray Photo Electron Spectroscopy) or Tof-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) to perform analysis on Solar Cell and OLED types of samples and related important applications. Under the well-organizing from the committee association, the conference had achieved great outcome and purpose of new technologies sharing.   Conference Room   Ms. Lucy Lu presenting the new Surface Analysis application

Our newsletter Vol. 0042 - Introduction on Energy analyzer for Electrical particles used in typical analytical instrumentation is released now!   You may read the full version either by accessing Technical Info > Newsletter or click here!

Our newsletter Vol. 0041 - XPS - Powder sample discussion is released now!     You may read the full version either by accessing Technical Info > Newsletter or click here!

Our newsletter Vol. 0040 - Data reduction of AES depth profiling by using LLS and TFA is released now!     You may read the full version either by accessing Technical Info > Newsletter or click here!